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Identification of Emissive Interface-Related Defects in Polyfluorene-Based Light Emitting Devices
Gamerith, Stefan, Nothofer, Heinz-Georg, Scherf, Ullrich, List, Emil J. W.Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.L891
Date:
June, 2004
File:
PDF, 153 KB
english, 2004