Ultra-Short Pulse Current–Voltage Characterization of the Intrinsic Characteristics of High-κ Devices
Young, Chadwin D., Zhao, Yuegang, Pendley, Michael, Lee, Byoung Hun, Matthews, Kenneth, Sim, Jang Hoan, Choi, Rino, Brown, George A., Murto, Robert W., Bersuker, GennadiVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.2437
Date:
April, 2005
File:
PDF, 363 KB
english, 2005