High Sensitive Imaging of Atomic Arrangement of Ge Clusters...

Japanese Journal of Applied Physics 2006 / 6 Vol. 45; Iss. 6A

High Sensitive Imaging of Atomic Arrangement of Ge Clusters Buried in a Si Crystal by X-ray Fluorescence Holography

Kusano, Shuji, Nakatani, Shinichiro, Sumitani, Kazushi, Takahashi, Toshio, Yoda, Yoshitaka, Usami, Noritaka, Shiraki, Yasuhiro
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Volume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.5248
Date:
June, 2006
File:
PDF, 518 KB
english, 2006
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