Influence on Accelerated Soft Error Rate in Static Random Access Memory using Metal Plate Capacitor Structure
Kim, Do-Woo, Gong, Myeong-Kook, Wang, Jin-SukVolume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.6837
Date:
September, 2006
File:
PDF, 198 KB
english, 2006