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Threshold-Voltage Modeling of Bulk Fin Field Transistors by Considering Surface Potential Lowering
Choi, Byung-Kil, Lee, Jong-HoVolume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.3396
Date:
May, 2008
File:
PDF, 331 KB
english, 2008