Novel Air-gap Formation Technology Using Ru Barrier Metal for Cu Interconnects with High Reliability and Low Capacitance
Takigawa, Yukio, Tarumi, Nobuaki, Shiohara, Morio, Soda, Eiichi, Oda, Noriaki, Ogawa, ShinichiVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.016503
Date:
January, 2011
File:
PDF, 507 KB
english, 2011