The Ion-Induced Emission Electron Microscope and an Image...

Japanese Journal of Applied Physics 1969 / 4 Vol. 8; Iss. 4

The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination

Uchikawa, Yoshiki, Kojima, Masayuki, Ichihashi, Mikio, Maruse, Susumu
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Volume:
8
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.8.436
Date:
April, 1969
File:
PDF, 1.34 MB
1969
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