Determination of micrometer length scales with an X-ray...

EPL (Europhysics Letters) 1998 / 06 Vol. 42; Iss. 5

Determination of micrometer length scales with an X-ray reflection ultra small-angle scattering set-up

Müller-Buschbaum, P, Casagrande, M, Gutmann, J, Kuhlmann, T, Stamm, M, Krosigk, G. von, Lode, U, Cunis, S, Gehrke, R
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Volume:
42
Language:
english
Journal:
Europhysics Letters (EPL)
DOI:
10.1209/epl/i1998-00282-0
Date:
June, 1998
File:
PDF, 344 KB
english, 1998
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