Additional confirmation of a generalized analytical model based on multistage scattering phenomena to evaluate the ionization rates of charge carriers in semiconductors
Acharyya, Aritra, Chatterjee, Subhashri, Das, Adrija, Banerjee, Apala, Pandey, Aditya Raj, Yadav, Aloke, Banerjee, J. P.Volume:
15
Language:
english
Journal:
Journal of Computational Electronics
DOI:
10.1007/s10825-015-0746-5
Date:
March, 2016
File:
PDF, 1.07 MB
english, 2016