SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 21 August 2011)] Time and Frequency Metrology III - Precision spectroscopy on atomic hydrogen
Parthey, Christian G., Matveev, Arthur, Alnis, Janis, Beyer, Axel, Pohl, Randolf, Predehl, Katharina, Udem, Thomas, Kolachevsky, Nikolai, Abgrall, Michel, Rovera, Daniele, Salomon, Christophe, LaurentVolume:
8132
Year:
2011
Language:
english
DOI:
10.1117/12.893694
File:
PDF, 812 KB
english, 2011