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Damage Effects in Silicon Surface Barrier Detectors by 0.5-1.5 MeV Electrons
Nakamoto, Shunsuke, Aoki, Takashi, Kawabata, Keishi, Norisawa, Keizo, Sakisaka, MasakatsuVolume:
12
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.12.1493
Date:
October, 1973
File:
PDF, 859 KB
1973