The Lateral Electric Field Model for Substrate and Gate...

Japanese Journal of Applied Physics 1993 / 1 Vol. 32; Iss. Part 1, No

The Lateral Electric Field Model for Substrate and Gate Current of Stressed SC-PMOSFET

Yang, Kwang Sun, Park, Jong Tae, Kim, Bong Ryul
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Volume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.32.429
Date:
January, 1993
File:
PDF, 639 KB
1993
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