Atomic Force Microscopy Observation of the Initial Growth...

Japanese Journal of Applied Physics 1997 / 9 Vol. 36; Iss. Part 1, No

Atomic Force Microscopy Observation of the Initial Growth Stage and the Ferroelectric Properties of B i 2V O 5.5 Films on S r T i O 3 (100) , Si(100) Substrates

Yanagita, Takeshi, Tabata, Hitoshi, Kawai, Tomoji
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Volume:
36
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.36.5917
Date:
September, 1997
File:
PDF, 1.28 MB
1997
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