In Situ X-Ray Diffractometry of Cristobalite Formation...

In Situ X-Ray Diffractometry of Cristobalite Formation during High-Temperature Oxidation of SiC Films

Kingetsu, Toshiki, Ito, Kenjiro, Takehara, Masaharu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.37.4160
Date:
July, 1998
File:
PDF, 416 KB
1998
Conversion to is in progress
Conversion to is failed