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Hot Carrier Effect in Low-Temperature poly-Si p-ch Thin-Film Transistors under Dynamic Stress
Uraoka, Yukiharu, Yano, Hiroshi, Hatayama, Tomoaki, Fuyuki, TakashiVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.41.l13
Date:
January, 2002
File:
PDF, 164 KB
english, 2002