A New Scheme for Imaging On-Chip Dry DNA Spots using Optical/Potential Dual-Image Complementary Metal Oxide Semiconductor Sensor
Tokuda, Takashi, Kadowaki, Issei, Kagawa, Keiichiro, Nunoshita, Masahiro, Ohta, JunVolume:
46
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.46.2806
Date:
April, 2007
File:
PDF, 189 KB
english, 2007