Influence of Surrounding Dielectrics on the Data Retention...

Japanese Journal of Applied Physics 2011 / 2 Vol. 50; Iss. 2

Influence of Surrounding Dielectrics on the Data Retention Time of Doped Sb 2 Te Phase Change Material

Jedema, Friso, in `t Zandt, Micha, Wolters, Rob, Gravesteijn, Dirk
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.50.024102
Date:
February, 2011
File:
PDF, 314 KB
english, 2011
Conversion to is in progress
Conversion to is failed