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Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition
Endo, Koichi, Norimatsu, Kenji, Nakamura, Tomonori, Setoya, Takashi, Nakamae, KojiLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.031
Date:
June, 2015
File:
PDF, 2.84 MB
english, 2015