Thermoreflectance mapping observation of Power MOSFET under...

  • Main
  • 2015 / 6
  • Thermoreflectance mapping observation of Power MOSFET under...

Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition

Endo, Koichi, Norimatsu, Kenji, Nakamura, Tomonori, Setoya, Takashi, Nakamae, Koji
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.031
Date:
June, 2015
File:
PDF, 2.84 MB
english, 2015
Conversion to is in progress
Conversion to is failed