Electromigration and potentiometry measurements of...

Journal of Physics Condensed Matter 2009 / 07 Vol. 21; Iss. 26

Electromigration and potentiometry measurements of single-crystalline Ag nanowires under UHV conditions

Kaspers, M R, Bernhart, A M, Meyer zu Heringdorf, F-J, Dumpich, G, Möller, R
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Volume:
21
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/21/26/265601
Date:
July, 2009
File:
PDF, 844 KB
english, 2009
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