Scanning force microscopy three-dimensional modes applied...

Scanning force microscopy three-dimensional modes applied to conductivity measurements through linear-chain organic SAMs

Munuera, C, Barrena, E, Ocal, C
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Volume:
18
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/18/12/125505
Date:
March, 2007
File:
PDF, 1.06 MB
english, 2007
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