Scanning force microscopy three-dimensional modes applied to conductivity measurements through linear-chain organic SAMs
Munuera, C, Barrena, E, Ocal, CVolume:
18
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/18/12/125505
Date:
March, 2007
File:
PDF, 1.06 MB
english, 2007