[IEEE 2015 16th International Conference of Young...

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[IEEE 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Russia (2015.6.29-2015.7.3)] 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - GaAs MBE on vicinal substrates Si (001): Impact of nucleation and growth conditions on crystallographic properties of the epitaxial layers

Petrushkov, Mikhail O., Putyato, Mikhail A., Preobrazhenskii, Valerii V., Semyagin, Boris R., Emelyanov, Eugene A.
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Year:
2015
Language:
english
DOI:
10.1109/EDM.2015.7184488
File:
PDF, 558 KB
english, 2015
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