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[IEEE 2014 IEEE 17th International Multi-Topic Conference (INMIC) - Karachi, Pakistan (2014.12.8-2014.12.10)] 17th IEEE International Multi Topic Conference 2014 - iDevice forensics - Data integrity
Ahmed, Maryam Jalees, Khalid, Umar, Aslam, BaberYear:
2014
Language:
english
DOI:
10.1109/INMIC.2014.7097348
File:
PDF, 907 KB
english, 2014