MOS Gate Etching Using an Advanced Magnetron Etching System
Noda, Shuichi, Nishikawa, Satoshi, Ohno, SeigoVolume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.2362
Date:
November, 1989
File:
PDF, 1.08 MB
1989