Sensitivity Calibration of a VUV System by Branching Line...

Japanese Journal of Applied Physics 1990 / 12 Vol. 29; Iss. Part 1, No

Sensitivity Calibration of a VUV System by Branching Line Pairs of Highly Ionized Atoms

Mimura, Mikio, Sato, Kuninori, Akiyama, Ryuichi, Otsuka, Masamoto
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Volume:
29
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.2831
Date:
December, 1990
File:
PDF, 627 KB
1990
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