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Sensitivity Calibration of a VUV System by Branching Line Pairs of Highly Ionized Atoms
Mimura, Mikio, Sato, Kuninori, Akiyama, Ryuichi, Otsuka, MasamotoVolume:
29
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.2831
Date:
December, 1990
File:
PDF, 627 KB
1990