Field Ion-Scanning Tunneling Microscopy Study of C...

Japanese Journal of Applied Physics 1992 / 7 Vol. 31; Iss. Part 2, No

Field Ion-Scanning Tunneling Microscopy Study of C 60 on the Si(100) Surface

Hashizume, Tomihiro, Wang, Xiang-Dong, Nishina, Yuichiro, Shinohara, Hisanori, Saito, Yahachi, Kuk, Young, Sakurai, Toshio
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Volume:
31
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.L880
Date:
July, 1992
File:
PDF, 2.38 MB
1992
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