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[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Aging guardband reduction through selective flip-flop optimization
Golanbari, Mohammad Saber, Kiamehr, Saman, Ebrahimi, Mojtaba, Tahoori, Mehdi B.Year:
2015
Language:
english
DOI:
10.1109/ETS.2015.7138775
File:
PDF, 1.07 MB
english, 2015