[IEEE 2015 International Conference on Smart Technologies and Management for Computing, Communication, Controls, Energy and Materials (ICSTM) - Avadi,Chennai, India (2015.5.6-2015.5.8)] 2015 International Conference on Smart Technologies and Management for Computing, Communication, Controls, Energy and Materials (ICSTM) - Stepped segment LFSR for low test power BIST
Ram, B.V. Bhargav, Harish, G., Yelampalli, ShivaYear:
2015
Language:
english
DOI:
10.1109/ICSTM.2015.7225454
File:
PDF, 306 KB
english, 2015