[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - A collective relaxation model for resistance drift in phase change memory cells
Sebastian, Abu, Krebs, Daniel, Le Gallo, Manuel, Pozidis, Haralampos, Eleftheriou, EvangelosYear:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112808
File:
PDF, 962 KB
english, 2015