[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging
Gomez, Andres, Poehls, Leticia, Vargas, Fabian, Champac, VictorYear:
2015
Language:
english
DOI:
10.1109/VTS.2015.7116290
File:
PDF, 1.18 MB
english, 2015