[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA,...

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[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging

Gomez, Andres, Poehls, Leticia, Vargas, Fabian, Champac, Victor
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Year:
2015
Language:
english
DOI:
10.1109/VTS.2015.7116290
File:
PDF, 1.18 MB
english, 2015
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