![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Bias dependence of LF drain and gate noise in GaN HEMTs
Malbert, Nathalie, Labat, Nathalie, Curutchet, Arnaud, Verdier, Frederic, Touboul, Andre, Danneville, Francois, Bonani, Fabrizio, Deen, M. Jamal, Levinshtein, Michael E.Volume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.547061
File:
PDF, 1.10 MB
english, 2004