[IEEE 3rd IEEE International Conference on Image Processing - Lausanne, Switzerland (16-19 Sept. 1996)] Proceedings of 3rd IEEE International Conference on Image Processing - Automatic inspection of solder joints using layered illumination
Tae-Hyeon Kim,, Tai-Hoon Cho,, Young-Shik Moon,, Sung-Han Park,Volume:
1
Year:
1996
Language:
english
DOI:
10.1109/icip.1996.560960
File:
PDF, 338 KB
english, 1996