![](/img/cover-not-exists.png)
Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements
C. Hombourger, P. Jonnard, J. -M. André, J. -P. ChauvineauVolume:
28
Year:
1999
Language:
english
Pages:
5
DOI:
10.1002/(sici)1097-4539(199905/06)28:33.0.co;2-z
File:
PDF, 86 KB
english, 1999