Use of layered synthetic microstructures for the...

Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements

C. Hombourger, P. Jonnard, J. -M. André, J. -P. Chauvineau
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Volume:
28
Year:
1999
Language:
english
Pages:
5
DOI:
10.1002/(sici)1097-4539(199905/06)28:33.0.co;2-z
File:
PDF, 86 KB
english, 1999
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