[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - A novel and practical method for in-situ monitoring of interface delamination by local thermal diffusivity measurement
Wunderle, B., Schulz, M., Braun, T., Sheva, S., May, D., Bauer, J., Bader, V., Hoelck, O., Walter, H., Keller, J.Year:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159629
File:
PDF, 1.81 MB
english, 2015