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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - SFF-8431 12.5Gbps channel return loss (RL) failure debug: Simulation and measurement validation
Mi, Minhong, Aude, Arlo, Chen, Jie, Murugan, RajenYear:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159640
File:
PDF, 1.01 MB
english, 2015