![](/img/cover-not-exists.png)
[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - A comprehensive reliability study on a CoWoS 3D IC package
Hariharan, Ganesh, Chaware, Raghunandan, Singh, Inderjit, Lin, Jeff, Yip, Laurene, Ng, Kenny, Pai, SYYear:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159648
File:
PDF, 908 KB
english, 2015