[IEEE 2014 IEEE 36th International Electronics Manufacturing Technology Conference (IEMT) - Johor, Malaysia (2014.11.11-2014.11.13)] 36th International Electronics Manufacturing Technology Conference - Ultralow residue (ULR) semiconductor grade fluxes for copper pillar flip-chip
Lim, SzePei, Chou, Jason, Durham, Maria, Jo, Hyoryoon, Mackie, AndyYear:
2014
Language:
english
DOI:
10.1109/IEMT.2014.7123075
File:
PDF, 855 KB
english, 2014