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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs
Gasiot, Gilles, Soussan, Dimitri, Autran, Jean-Luc, Malherbe, Victor, Roche, PhilippeYear:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112677
File:
PDF, 1.45 MB
english, 2015