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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs
Narasimham, Balaji, Wang, Jung K., Vedula, Narayana, Gupta, Saket, Bartz, Brandon, Monzel, Carl, Chatterjee, Indranil, Bhuva, Bharat L., Schrimpf, Ronald D., Reed, Robert A.Year:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112679
File:
PDF, 333 KB
english, 2015