[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Diagnostic electromigration reliability evaluation with a local sensing structure
Chen, Fen, Mccullen, Erik, Christiansen, Cathryn, Shinosky, Michael, Dufresne, Roger, Periasamy, Prakash, Kontra, Rick, Graas, Carole, StOnge, GaryYear:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112683
File:
PDF, 668 KB
english, 2015