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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Lee, Soonyoung, Kim, Ilgon, Ha, Sungmock, Yu, Cheong-sik, Noh, Jinhyun, Pae, Sangwoo, Park, JongwooYear:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112728
File:
PDF, 362 KB
english, 2015