[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - The electromigration behavior of copper pillars for different current directions and pillar shapes
Hau-Riege, Christine, Yau, You Wen, Caffey, Kevin, Kumar, Rajneesh, Sun, YangYang, Bao, Andy, Shah, Milind, Zhao, Lily, Bchir, Omar, Syed, Ahmer, Bezuk, SteveYear:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112750
File:
PDF, 1.03 MB
english, 2015