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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Package induced stress impact on transistor performance for ultra-thin SoC
Kabir, Md. Enamul, Young, Dave, Kilic, Bahattin, Sauciuc, Ioan, Sapp, Carl, Leatherman, Gerald S.Year:
2015
Language:
english
DOI:
10.1109/IRPS.2015.7112754
File:
PDF, 511 KB
english, 2015