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[IEEE NAECON 2014 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2014.6.24-2014.6.27)] NAECON 2014 - IEEE National Aerospace and Electronics Conference - THz on-wafer calibration using offset-shorts and known through as standards

Caglayan, Cosan, Trichopoulos, Georgios C., Sertel, Kubilay
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Year:
2014
Language:
english
DOI:
10.1109/NAECON.2014.7045823
File:
PDF, 600 KB
english, 2014
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