[IEEE NAECON 2014 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2014.6.24-2014.6.27)] NAECON 2014 - IEEE National Aerospace and Electronics Conference - THz on-wafer calibration using offset-shorts and known through as standards
Caglayan, Cosan, Trichopoulos, Georgios C., Sertel, KubilayYear:
2014
Language:
english
DOI:
10.1109/NAECON.2014.7045823
File:
PDF, 600 KB
english, 2014