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[IEEE NAECON 2014 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2014.6.24-2014.6.27)] NAECON 2014 - IEEE National Aerospace and Electronics Conference - Gate-level commercial microelectronics verification with standard cell recognition
Hsia, Leleia A., Lanzerotti, Mary Y., Seery, Michael K., Orlando, LenYear:
2014
Language:
english
DOI:
10.1109/NAECON.2014.7045839
File:
PDF, 778 KB
english, 2014