[IEEE 2015 Annual Reliability and Maintainability Symposium (RAMS) - Palm Harbor, FL, USA (2015.1.26-2015.1.29)] 2015 Annual Reliability and Maintainability Symposium (RAMS) - Impact analysis of prior distributions on ADT Bayesian optimization design based on DIC
Zou, Tian-Ji, Li, Xiao-Yang, Li, Mei-JunYear:
2015
Language:
english
DOI:
10.1109/RAMS.2015.7105086
File:
PDF, 789 KB
english, 2015