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Comparative Analysis of Some Parametric Model Structures dedicated to EDLC Diagnosis
Schaeffer, Emmanuel, Auger, Francois, Shi, Zhihao, Guillemet, Philippe, Loron, LucYear:
2015
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2015.2465357
File:
PDF, 5.24 MB
english, 2015