SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Display the CIE 1931 color chromaticity diagram with digital image processing
Zhao, Hong-Dong, Yao, Yi-Yang, Sun, Fei, Zhang, Qin, Yang, Xiao-Hui, Lin, Xinggang, Zheng, JesseVolume:
9045
Year:
2013
Language:
english
DOI:
10.1117/12.2033411
File:
PDF, 284 KB
english, 2013