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[ACM Press the 6th ACM/IEEE-CS joint conference - Chapel Hill, NC, USA (2006.06.11-2006.06.15)] Proceedings of the 6th ACM/IEEE-CS joint conference on Digital libraries - JCDL '06 - Learning from artifacts
Moen, William E., Miksa, Shawne D., Eklund, Amy, Polyakov, Serhiy, Snyder, GregoryYear:
2006
Language:
english
DOI:
10.1145/1141753.1141813
File:
PDF, 179 KB
english, 2006