Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)
Ralston, John, Larson, Ian, Rutland, Mark W., Feiler, Adam A., Kleijn, MiekeVolume:
77
Language:
english
Journal:
Pure and Applied Chemistry
DOI:
10.1351/pac200577122149
Date:
January, 2005
File:
PDF, 535 KB
english, 2005