Study of the growth morphology of TiO2 thin films by AFM...

Surface and Coatings Technology 2001 Vol. 140; Iss. 2

Study of the growth morphology of TiO2 thin films by AFM and TEM

Y. Leprince-Wang, K. Yu-Zhang
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Volume:
140
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0257-8972(01)01029-5
File:
PDF, 1.28 MB
english, 2001
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